Invention Grant
- Patent Title: Method for calibrating or monitoring performance of an optical measurement device
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Application No.: US17321907Application Date: 2021-05-17
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Publication No.: US11543349B2Publication Date: 2023-01-03
- Inventor: Norbert D. Hagen , David Opalsky , George T. Walker , Byron J. Knight
- Applicant: GEN-PROBE INCORPORATED
- Applicant Address: US CA San Diego
- Assignee: GEN-PROBE INCORPORATED
- Current Assignee: GEN-PROBE INCORPORATED
- Current Assignee Address: US CA San Diego
- Agent Charles B. Cappellari
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N21/27

Abstract:
Method for calibrating or monitoring performance of an optical measurement device that includes using a robotic arm to move a reference device having an optical reference material into a signal-detecting position of the optical measurement device. With the optical measurement device, detecting an emission emitted by the optical reference material of the reference device in the signal-detecting position. Then generating a reference signal representing a characteristic of the emission detected by the optical measurement device and comparing the reference signal to an expected reference signal for the emission to calibrate or monitor the performance of the optical measurement device.
Public/Granted literature
- US20210270738A1 METHOD FOR CALIBRATING OR MONITORING PERFORMANCE OF AN OPTICAL MEASUREMENT DEVICE Public/Granted day:2021-09-02
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