Invention Grant
- Patent Title: Impedance measurement in diagnostic testing
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Application No.: US16757202Application Date: 2018-05-04
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Publication No.: US11543402B2Publication Date: 2023-01-03
- Inventor: Thomas G. O'Dwyer , Gaurav Vohra , Xin Zhang , YounJae Kook , Isaac Chase Novet , Venugopal Gopinathan
- Applicant: Analog Devices, Inc.
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Akona IP PC
- International Application: PCT/US2018/031241 WO 20180504
- International Announcement: WO2019/078922 WO 20190425
- Main IPC: G01R33/09
- IPC: G01R33/09 ; G01N33/487 ; G01N27/02 ; G01N33/49 ; G01N33/493 ; G01N27/12 ; G01N27/22

Abstract:
An impedance measurement system for detecting an analyte in a sample is disclosed. The system includes first, second, and third electrodes, wherein at least a portion of the third electrode is positioned between the first and second electrodes, means for generating an electromagnetic field between the first and second electrodes, means for electrically controlling the third electrode, wherein the third electrode modifies the electromagnetic field, and a processor for detecting a presence of the analyte in the sample, based at least in part on a property of the electromagnetic field.
Public/Granted literature
- US20210123902A1 IMPEDANCE MEASUREMENT IN DIAGNOSTIC TESTING Public/Granted day:2021-04-29
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