Invention Grant
- Patent Title: Metal microscopic structure and detection device
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Application No.: US17071578Application Date: 2020-10-15
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Publication No.: US11567069B2Publication Date: 2023-01-31
- Inventor: Takashi Kanno , Hiroto Yanagawa
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JPJP2018-157377 20180824
- Main IPC: G01N33/543
- IPC: G01N33/543 ; G01N21/64 ; G01N33/553 ; B82Y15/00 ; G02B5/00

Abstract:
One non-limiting and exemplary embodiment provides a metal microscopic structure capable of detecting a low-concentration analyte with high sensitivity. The metal microscopic structure includes a base member including multiple protrusions arrayed at predetermined intervals, and multiple projections made of a metal film covering the base member and configured to generate surface plasmons upon irradiation with light. A film thickness of the metal film positioned in a bottom portion of a gap between every adjacent two of the multiple projections is greater than a height of the multiple protrusions and is more than or equal to 90% and less than or equal to 100% of a film thickness of the metal film deposited on top portions of the multiple protrusions.
Public/Granted literature
- US20210025884A1 METAL MICROSCOPIC STRUCTURE AND DETECTION DEVICE Public/Granted day:2021-01-28
Information query
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