Invention Grant
- Patent Title: Semiconductor device including voltage monitoring circuit for monitoring a voltage state of the semiconductor device
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Application No.: US17184123Application Date: 2021-02-24
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Publication No.: US11574672B2Publication Date: 2023-02-07
- Inventor: Yoshinao Suzuki
- Applicant: Kioxia Corporation
- Applicant Address: JP Tokyo
- Assignee: Kioxia Corporation
- Current Assignee: Kioxia Corporation
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JPJP2020-148965 20200904
- Main IPC: G11C11/4093
- IPC: G11C11/4093 ; G11C5/06 ; G11C11/408 ; G11C11/4074

Abstract:
A semiconductor device includes a first pad, a comparison circuit, and a control circuit. A first voltage may be applicable to the first pad. The comparison circuit may include a first input terminal connected to the first pad, a second input terminal to which a second voltage is applicable, and an output terminal configured to output a comparison result between the first voltage and the second voltage. The control circuit may be configured to output, external to the semiconductor device, a signal based on the comparison result.
Public/Granted literature
- US20220076734A1 SEMICONDUCTOR DEVICE Public/Granted day:2022-03-10
Information query
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