Invention Grant
- Patent Title: Mass flow verification based on rate of pressure decay
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Application No.: US17247091Application Date: 2020-11-30
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Publication No.: US11604089B2Publication Date: 2023-03-14
- Inventor: Zhiyuan Ye , Justin Hough , Marcel E. Josephson
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Lowenstein Sandler LLP
- Main IPC: G01F25/17
- IPC: G01F25/17 ; G01F1/36 ; G05D7/06 ; G05B23/02 ; G01F1/50 ; G01F1/38 ; G01F25/10 ; G01F1/42 ; H01L21/67

Abstract:
An electronic device manufacturing system includes: a gas supply; a mass flow controller (MFC) coupled to the gas supply; an inlet coupled to the MFC; an outlet; a control volume serially coupled to the inlet to receive a gas flow; and a flow restrictor serially coupled to the control volume and the outlet. A controller is adapted to allow the gas supply to flow gas through the control volume and the flow restrictor to achieve a stable pressure in the control volume, terminate the gas flow from the gas supply, and measure a rate of pressure decay in the control volume over time. A process chamber is coupled to a flow path, which is coupled to the mass flow controller, the process chamber to receive one or more process chemistries via the mass flow controller.
Public/Granted literature
- US20210080313A1 MASS FLOW VERIFICATON BASED ON RATE OF PRESSURE DECAY Public/Granted day:2021-03-18
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