Invention Grant
- Patent Title: Sample observation device and sample observation method
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Application No.: US17488659Application Date: 2021-09-29
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Publication No.: US11630064B2Publication Date: 2023-04-18
- Inventor: Norikazu Sugiyama , Masanori Matsubara , Satoshi Yamamoto
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JP2017-135423 20170711
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N21/51 ; G01N21/17

Abstract:
A sample observation device includes an irradiation unit that irradiates a sample with planar light, a scanning unit that scans the sample in one direction with respect to an irradiation surface of the planar light, an image formation unit that forms images of fluorescent light and scattered light from the sample, an imaging unit that outputs first image data based on a light image of the fluorescent light and second image data based on a light image of the scattered light, an image processing unit that generates a fluorescent light image on the basis of a plurality of pieces of first image data and generates a scattered light image on the basis of a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample in the fluorescent light image on the basis of the scattered light image, and sets an analysis area in the fluorescent light image on the basis of the area in which there is the sample.
Public/Granted literature
- US20220034811A1 SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD Public/Granted day:2022-02-03
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