公开(公告)号：US12140742B2

公开(公告)日：2024-11-12

申请号：US17924160

申请日：2021-03-17

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masanori Kobayashi ,  Satoshi Yamamoto

IPC: G02B21/00 ,  G01N21/64

Abstract: A light irradiation device includes: a light source configured to output light having coherence; a light focusing element having a focusing axis and a non-focusing axis intersecting with the focusing axis and configured to focus the light on a focusing line so as to generate planar light; and an aperture mask having an opening part that limits a part of luminous fluxes of the light transmitted from the light source to the light focusing element. The opening part of the aperture mask has opening edges disposed to extend in a direction along the focusing axis of the light focusing element, and, in a case in which the opening edges are projected onto the focusing line, corresponding projected portions have linear spreads.

公开(公告)号：USD1015566S1

公开(公告)日：2024-02-20

申请号：US29759206

申请日：2020-11-20

Applicant: HAMAMATSU PHOTONICS K.K.

Designer： Satoshi Yamamoto

Abstract: FIG. 1 is a front view of an adjustment plate for observation device for samples such as cells of the first embodiment of the present invention;
FIG. 2 is a rear view thereof;
FIG. 3 is an enlarged view showing a portion 3 of FIG. 2;
FIG. 4 is an enlarged view showing a portion 4 of FIG. 2;
FIG. 5 is an enlarged view showing a portion 5 of FIG. 2;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof;
FIG. 8 is a right side view thereof;
FIG. 9 is a left side view thereof;
FIG. 10 is a front, top plan and left side perspective view thereof;
FIG. 11 is a rear, top plan and right side perspective view thereof;
FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 1;
FIG. 13 is an enlarged cross-sectional view along the line 13-13 in FIG. 1;
FIG. 14 is an enlarged cross-sectional view along the line 14-14 in FIG. 1;
FIG. 15 is an enlarged view showing a portion 15 of FIG. 3;
FIG. 16 is an enlarged view showing a portion 16 of FIG. 4;
FIG. 17 is an enlarged view showing a portion 17 of FIG. 3;
FIG. 18 is an enlarged view showing a portion 18 of FIG. 5;
FIG. 19 is an enlarged view showing a portion 19 of FIG. 5;
FIG. 20 is a front view of an adjustment plate for observation device for samples such as cells of the second embodiment of the present invention;
FIG. 21 is a rear view thereof;
FIG. 22 is an enlarged view showing a portion 22 of FIG. 21;
FIG. 23 is an enlarged view showing a portion 23 of FIG. 21;
FIG. 24 is an enlarged view showing a portion 24 of FIG. 21;
FIG. 25 is a top plan view thereof;
FIG. 26 is a bottom plan view thereof;
FIG. 27 is a right side view thereof;
FIG. 28 is a left side view thereof;
FIG. 29 is a front, top plan and left side perspective view thereof;
FIG. 30 is a rear, top plan and right side perspective view thereof;
FIG. 31 is an enlarged cross-sectional view along the line 31-31 in FIG. 20;
FIG. 32 is an enlarged cross-sectional view along the line 32-32 in FIG. 20;
FIG. 33 is an enlarged cross-sectional view along the line 33-33 in FIG. 20;
FIG. 34 is an enlarged view showing a portion 34 of FIG. 22;
FIG. 35 is an enlarged view showing a portion 35 of FIG. 23;
FIG. 36 is an enlarged view showing a portion 36 of FIG. 22;
FIG. 37 is an enlarged view showing a portion 37 of FIG. 24; and,
FIG. 38 is an enlarged view showing a portion 38 of FIG. 24.
The features shown in evenly-dashed broken lines depict environmental subject matter only and form no part of the claimed design. The dot-dash broken lines in the drawings represent the bounds of the claimed subject matter, the dot-dash lines, themselves forming no part thereof. The dot-dot-dash lines in the drawings depict the boundaries of the enlarged views that form no part of the claimed design.

公开(公告)号：US11874224B2

公开(公告)日：2024-01-16

申请号：US16631927

申请日：2018-05-30

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Satoshi Yamamoto ,  Masanori Matsubara ,  Norikazu Sugiyama ,  Masanori Kobayashi

IPC: G01N21/51 ,  G01N1/20 ,  G01N21/53 ,  G02B5/04 ,  G01N21/17 ,  G01N21/47

CPC classification number: G01N21/51 ,  G01N1/2035 ,  G01N21/534 ,  G02B5/04 ,  G01N2021/1765 ,  G01N2021/4769

Abstract: A sample observation device includes a flow cell in which a fluid containing samples flows, an irradiation unit configured to irradiate the samples flowing in the flow cell with planar light, an image formation unit having an observation axis inclined with respect to an irradiation surface for the planar light, and configured to form an image of observation light generated in the sample due to the irradiation with the planar light, a two-dimensional imaging element configured to capture a light image including at least a cross section of the fluid among light images according to the observation light formed by the image formation unit, and outputs image data, and an analysis unit configured to analyze a light intensity profile of the sample in a flow direction of the fluid on the basis of the image data.

公开(公告)号：US11630064B2

公开(公告)日：2023-04-18

申请号：US17488659

申请日：2021-09-29

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Norikazu Sugiyama ,  Masanori Matsubara ,  Satoshi Yamamoto

IPC: G01N21/64 ,  G01N21/51 ,  G01N21/17

Abstract: A sample observation device includes an irradiation unit that irradiates a sample with planar light, a scanning unit that scans the sample in one direction with respect to an irradiation surface of the planar light, an image formation unit that forms images of fluorescent light and scattered light from the sample, an imaging unit that outputs first image data based on a light image of the fluorescent light and second image data based on a light image of the scattered light, an image processing unit that generates a fluorescent light image on the basis of a plurality of pieces of first image data and generates a scattered light image on the basis of a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample in the fluorescent light image on the basis of the scattered light image, and sets an analysis area in the fluorescent light image on the basis of the area in which there is the sample.

公开(公告)号：US11353402B2

公开(公告)日：2022-06-07

申请号：US16629220

申请日：2018-04-16

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Norikazu Sugiyama ,  Masanori Matsubara ,  Satoshi Yamamoto

IPC: G01N21/64

Abstract: A sample observation device includes a sample container that holds the sample stained with a first fluorescent substance and a solution including a second fluorescent substance, an irradiation unit that performs irradiation with first excitation light and second excitation light, a scanning unit that scans the sample container in one direction, an image formation unit that forms first fluorescent light from the sample and second fluorescent light from the solution, an imaging unit that outputs first image data based on the first fluorescent light and first image data based on the second fluorescent light, an image processing unit that generates a first fluorescent light image based on a plurality of pieces of first image data and a second fluorescent light image based on a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample on the basis of the second fluorescent light image and sets an analysis area in the first fluorescent light image.

公开(公告)号：US10180525B2

公开(公告)日：2019-01-15

申请号：US15313195

申请日：2015-05-15

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Satoshi Yamamoto ,  Kenshi Fukumitsu

IPC: F21V8/00 ,  F21S2/00 ,  G01N21/01 ,  G01N21/03 ,  G01N21/27 ,  G01N21/64 ,  G02B6/00 ,  B23K26/53 ,  B23K26/00 ,  B23K26/03 ,  G01N21/47 ,  G01N21/55 ,  G01N33/483 ,  A61B5/1455 ,  G01N21/25 ,  G01N21/49

Abstract: An optical plate is an optical plate for irradiating a target with light, and includes a light input surface for inputting the light, a light output surface for outputting the light, a back surface opposite to the light output surface, and a light diffusion portion formed at least inside the optical plate by converging laser light, for diffusing the light. The light input surface is a surface between the light output surface and the back surface, and the light input from the light input surface is diffused in the light diffusion portion and output from the light output surface.

公开(公告)号：US12031911B2

公开(公告)日：2024-07-09

申请号：US17699834

申请日：2022-03-21

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Norikazu Sugiyama ,  Masanori Matsubara ,  Satoshi Yamamoto

IPC: G01N21/64

CPC classification number: G01N21/6428 ,  G01N21/6456 ,  G01N2021/6439

Abstract: A sample observation device includes a sample container that holds the sample stained with a first fluorescent substance and a solution including a second fluorescent substance, an irradiation unit that performs irradiation with first excitation light and second excitation light, a scanning unit that scans the sample container in one direction, an image formation unit that forms first fluorescent light from the sample and second fluorescent light from the solution, an imaging unit that outputs first image data based on the first fluorescent light and first image data based on the second fluorescent light, an image processing unit that generates a first fluorescent light image based on a plurality of pieces of first image data and a second fluorescent light image based on a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample on the basis of the second fluorescent light image and sets an analysis area in the first fluorescent light image.

公开(公告)号：US11852792B2

公开(公告)日：2023-12-26

申请号：US16981969

申请日：2019-01-10

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masanori Kobayashi ,  Satoshi Yamamoto

IPC: G02B21/06 ,  G02B21/00

CPC classification number: G02B21/0052 ,  G02B21/008 ,  G02B21/06

Abstract: A sample observation device includes: an emission optical system that emits planar light to a sample; a scanning unit that scans the sample in one direction so as to pass through an emission surface of the planar light; an imaging optical system that has an observation axis inclined with respect to the emission surface and forms an image of observation light generated in the sample by emission of the planar light; an image acquisition unit that acquires image data corresponding to an optical image of the observation light formed by the imaging optical system; and an image generation unit that generates observation image data of the sample based on the image data acquired by the image acquisition unit. The imaging optical system has a non-axisymmetric optical element that bends a light beam on one axis of the observation light but does not bend a light beam on the other axis perpendicular to the one axis.

公开(公告)号：US11169092B2

公开(公告)日：2021-11-09

申请号：US16629202

申请日：2018-04-18

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Norikazu Sugiyama ,  Masanori Matsubara ,  Satoshi Yamamoto

IPC: G01N21/51 ,  G01N21/64 ,  G01N21/17

Abstract: A sample observation device includes an irradiation unit that irradiates a sample with planar light, a scanning unit that scans the sample in one direction with respect to an irradiation surface of the planar light, an image formation unit that forms images of fluorescent light and scattered light from the sample, an imaging unit that outputs first image data based on a light image of the fluorescent light and second image data based on a light image of the scattered light, an image processing unit that generates a fluorescent light image on the basis of a plurality of pieces of first image data and generates a scattered light image on the basis of a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample in the fluorescent light image on the basis of the scattered light image, and sets an analysis area in the fluorescent light image on the basis of the area in which there is the sample.

公开(公告)号：US11709350B2

公开(公告)日：2023-07-25

申请号：US17040091

申请日：2019-01-30

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Satoshi Yamamoto

IPC: G02B21/00 ,  G01N21/49 ,  G01N21/64 ,  G06T5/00 ,  G06T5/50

CPC classification number: G02B21/008 ,  G01N21/49 ,  G01N21/6428 ,  G01N21/6456 ,  G02B21/0032 ,  G02B21/0076 ,  G06T5/002 ,  G06T5/50 ,  G01N2021/6439 ,  G06T2207/10056 ,  G06T2207/20224

Abstract: A sample observation device includes: an emission optical system that emits planar light to a sample on an XZ plane; a scanning unit that scans the sample in a Y-axis direction so as to pass through an emission surface of the planar light; an imaging optical system that has an observation axis inclined with respect to the emission surface and forms an image of observation light generated in the sample; an image acquisition unit that acquires a plurality of pieces of XZ image data corresponding to an optical image of the observation light; and an image generation unit 8 that generates XY image data based on the plurality of pieces of XZ image data. The image generation unit extracts an analysis region of the plurality of pieces of XZ image data acquired in the Y-axis direction, integrates brightness values of at least the analysis region in a Z-axis direction to generate X image data, and combines the X image data in the Y-axis direction to generate the XY image data.