Invention Grant
- Patent Title: Set-while-verify circuit and reset-while verify circuit for resistive random access memory cells
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Application No.: US17199243Application Date: 2021-03-11
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Publication No.: US11646078B2Publication Date: 2023-05-09
- Inventor: Hieu Van Tran , Anh Ly , Thuan Vu , Stanley Hong , Feng Zhou , Xian Liu , Nhan Do
- Applicant: Silicon Storage Technology, Inc.
- Applicant Address: US CA San Jose
- Assignee: SILICON STORAGE TECHNOLOGY, INC.
- Current Assignee: SILICON STORAGE TECHNOLOGY, INC.
- Current Assignee Address: US CA San Jose
- Agency: DLA Piper LLP US
- The original application number of the division: US16119416 2018.08.31
- Main IPC: G11C7/22
- IPC: G11C7/22 ; G11C13/00

Abstract:
Numerous embodiments of circuitry for a set-while-verify operation and a reset-while verify operation for resistive random access memory cells are disclosed. In one embodiment, a set-while-verify circuit for performing a set operation on a selected RRAM cell in the array applies a combination of voltages or current to a bit line, word line, and source line associated with the selected RRAM cell and stops said applying when the set operation is complete. In another embodiment, a reset-while-verify circuit for performing a reset operation on a selected RRAM cell in the array applies a combination of voltages or current to a bit line, word line, and source line associated with the selected RRAM cell and stops said applying when the reset operation is complete.
Public/Granted literature
- US20210257023A1 Set-While-Verify Circuit And Reset-While Verify Circuit For Resistive Random Access Memory Cells Public/Granted day:2021-08-19
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