Invention Grant
- Patent Title: Test and measurement devices, systems and methods associated with augmented reality
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Application No.: US17539160Application Date: 2021-11-30
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Publication No.: US11650225B2Publication Date: 2023-05-16
- Inventor: Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Miller Nash LLP
- Agent Andrew J. Harrington
- Main IPC: G01R1/02
- IPC: G01R1/02 ; G01R13/02

Abstract:
A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
Public/Granted literature
- US20220196701A1 TEST AND MEASUREMENT DEVICES, SYSTEMS AND METHODS ASSOCIATED WITH AUGMENTED REALITY Public/Granted day:2022-06-23
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