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公开(公告)号：US20210148975A1
公开(公告)日：2021-05-20
申请号：US17098155
申请日：2020-11-13
申请人： Tektronix, Inc.
IPC分类号： G01R31/3177 , G06F30/32 , G05B19/042
摘要： A system for acquiring a test-and-measurement signal from a device under test (DUT) including a test-and-measurement probe, a user interface, a robot, and a controller. The probe is configured to acquire an electronic signal from the DUT. The user interface displays a digital representation of a physical electronic circuit of the DUT, including portrayals of virtual nodes that correspond to actual nodes on the DUT. The robot is configured to automatically position the probe with respect to the DUT. The controller is configured to receive from the user interface an electronic indication of a selected node of the digital representation of the physical electronic circuit, where the selected node is one of the virtual nodes. The controller is further configured to provide instructions to the robot to automatically position the probe to a position on the physical electronic circuit corresponding to the actual node.
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公开(公告)号：US11520966B2
公开(公告)日：2022-12-06
申请号：US17370976
申请日：2021-07-08
申请人： Tektronix, Inc.
IPC分类号： G06F30/367 , G06F30/3953 , G06F30/398 , G06F30/323 , G06F30/333 , G06F30/3308 , G01R31/3183 , G06F119/02
摘要： A method comprising categorizing nodes of a fabricated circuit as being priority nodes and nodes as being inferior nodes; evaluating a first priority node by automatically designating for verification the first priority node, and ascertaining whether a measured signal from the first priority node meets a pass-fail criterion for the first priority node; evaluating, when the measured signal from the first priority node meets the pass-fail criterion, a second priority node by automatically designating for verification the second priority node, and ascertaining whether a measured signal from the second priority node meets a pass-fail criterion for the second priority node; and evaluating, when the measured signal from the first priority node does not meet the pass-fail criterion, a first inferior node, by automatically designating for verification the first inferior node, and ascertaining whether a measured signal from the first inferior node meets a pass-fail criterion for the first inferior node.
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公开(公告)号：US20220012397A1
公开(公告)日：2022-01-13
申请号：US17370976
申请日：2021-07-08
申请人： Tektronix, Inc.
IPC分类号： G06F30/367 , G06F30/398 , G06F30/3953
摘要： A method comprising categorizing nodes of a fabricated circuit as being priority nodes and nodes as being inferior nodes; evaluating a first priority node by automatically designating for verification the first priority node, and ascertaining whether a measured signal from the first priority node meets a pass-fail criterion for the first priority node; evaluating, when the measured signal from the first priority node meets the pass-fail criterion, a second priority node by automatically designating for verification the second priority node, and ascertaining whether a measured signal from the second priority node meets a pass-fail criterion for the second priority node; and evaluating, when the measured signal from the first priority node does not meet the pass-fail criterion, a first inferior node, by automatically designating for verification the first inferior node, and ascertaining whether a measured signal from the first inferior node meets a pass-fail criterion for the first inferior node.
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公开(公告)号：US20220012394A1
公开(公告)日：2022-01-13
申请号：US17370930
申请日：2021-07-08
申请人： Tektronix, Inc.
IPC分类号： G06F30/3308 , G06F30/323 , G06F30/333 , G01R31/3183
摘要： A system for verifying signals in electronic circuits that includes a waveform translator and a test-and-measurement instrument. The waveform translator is configured to receive a simulated waveform for a node of a simulated prototype circuit and to translate the simulated waveform into a translated waveform. The test-and-measurement instrument is configured to obtain a measured waveform and to determine a deviation of the measured waveform from the simulated waveform using the translated waveform.
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公开(公告)号：US11714121B2
公开(公告)日：2023-08-01
申请号：US17370958
申请日：2021-07-08
申请人： Tektronix, Inc.
CPC分类号： G01R31/2818 , G01N21/9503 , H01L22/12
摘要： A method for indicating a probing target for a fabricated electronic circuit including: generating an electronic, three-dimensional model based on manufacturing layout information of a fabricated circuit; obtaining, with a vision system, visual environment information for the fabricated circuit; scaling and orienting the three-dimensional model by a scaler and mapper based on the visual environment information; overlaying the three-dimensional model with the visual environment information to produce a correlated image; obtaining an identification of a desired network node of the fabricated circuit; and indicating a probing target, the probing target corresponding to the desired network node of the fabricated circuit.
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公开(公告)号：US11650225B2
公开(公告)日：2023-05-16
申请号：US17539160
申请日：2021-11-30
申请人： Tektronix, Inc.
发明人： Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
CPC分类号： G01R1/025 , G01R13/0218
摘要： A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
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公开(公告)号：US20220196701A1
公开(公告)日：2022-06-23
申请号：US17539160
申请日：2021-11-30
申请人： Tektronix, Inc.
发明人： Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
摘要： A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
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公开(公告)号：US20220026483A1
公开(公告)日：2022-01-27
申请号：US17370958
申请日：2021-07-08
申请人： Tektronix, Inc.
摘要： A method for indicating a probing target for a fabricated electronic circuit including: generating an electronic, three-dimensional model based on manufacturing layout information of a fabricated circuit; obtaining, with a vision system, visual environment information for the fabricated circuit; scaling and orienting the three-dimensional model by a scaler and mapper based on the visual environment information; overlaying the three-dimensional model with the visual environment information to produce a correlated image; obtaining an identification of a desired network node of the fabricated circuit; and indicating a probing target, the probing target corresponding to the desired network node of the fabricated circuit.
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公开(公告)号：US11187720B2
公开(公告)日：2021-11-30
申请号：US16622847
申请日：2018-06-18
申请人： Tektronix, Inc.
发明人： Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
摘要： A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
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