Invention Grant
- Patent Title: Methods and systems for manufacturing printed circuit board based on x-ray inspection
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Application No.: US16924747Application Date: 2020-07-09
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Publication No.: US11651492B2Publication Date: 2023-05-16
- Inventor: David Lewis Adler , Scott Joseph Jewler , Freddie Erich Babian , Andrew George Reid , Benjamin Thomas Adler
- Applicant: Bruker Nano, Inc.
- Applicant Address: US CA Santa Barbara
- Assignee: Bruker Nano, Inc.
- Current Assignee: Bruker Nano, Inc.
- Current Assignee Address: US CA Santa Barbara
- Agency: Boyle Fredrickson S.C.
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01T1/20 ; G06T7/00 ; G06N20/00 ; G06F30/398 ; G01N23/083 ; G01N23/18 ; G06K9/62 ; G06T5/00 ; H01L21/67 ; H05K1/11 ; H05K3/40 ; G06F119/18 ; G06F115/12
Abstract:
In one embodiment, an X-ray inspection system may nondestructively inspect a printed circuit board to measure a number of dimensions at a number of pre-determined locations of the printed circuit board. The X-ray inspection system may generate a data set for the printed circuit board based on the measured dimensions. The X-ray inspection system may calculate one or more drilling values based on the data set of the printed circuit board. The X-ray inspection system may provide, to a drilling machine, instructions for drilling a number of plated-through vias based on the calculated drilling values for the printed circuit board.
Public/Granted literature
- US20210014979A1 Methods and Systems for Manufacturing Printed Circuit Board based on X-ray Inspection Public/Granted day:2021-01-14
Information query
