Invention Grant
- Patent Title: Product defect detection method, device and system
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Application No.: US17250263Application Date: 2020-08-26
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Publication No.: US11748873B2Publication Date: 2023-09-05
- Inventor: Jie Liu , Li Ma , Liang Zhang
- Applicant: GOERTEK INC.
- Applicant Address: CN Shandong
- Assignee: GOERTEK INC.
- Current Assignee: GOERTEK INC.
- Current Assignee Address: CN Shandong
- Agency: LKGlobal | Lorenz & Kopf, LLP
- Priority: CN 1911397513.X 2019.12.30
- International Application: PCT/CN2020/111327 2020.08.26
- International Announcement: WO2021/135302A 2021.07.08
- Date entered country: 2020-12-22
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/136 ; G06T7/11 ; G06T7/70 ; G01N21/88 ; G06N3/08 ; G06F18/214 ; G06F18/2431 ; G06F18/2413 ; G06V10/42 ; G06V10/764 ; G06V10/774 ; G06V10/82

Abstract:
A product defect detection method, device and system are disclosed. The product defect detection method comprises: constructing a defect detection framework including a classification network, a locating detection network and a judgment network; training the classification network by using a sample image of a product containing different defect types to obtain a classification network capable of classifying the defect types existing in the sample image; training the locating detection network by using a sample image of a product containing different defect types to obtain a locating detection network capable of locating a position of each type of defect in the sample image; inputting an acquired product image into the defect detection framework, inputting a classification result and a detection result obtained into the judgment network to judge whether the product has a defect, and detecting a defect type and a defect position when the product has a defect.
Public/Granted literature
- US20210374941A1 PRODUCT DEFECT DETECTION METHOD, DEVICE AND SYSTEM Public/Granted day:2021-12-02
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