公开(公告)号：US11748873B2

公开(公告)日：2023-09-05

申请号：US17250263

申请日：2020-08-26

Applicant: GOERTEK INC.

Inventor： Jie Liu ,  Li Ma ,  Liang Zhang

IPC: G06T7/00 ,  G06T7/136 ,  G06T7/11 ,  G06T7/70 ,  G01N21/88 ,  G06N3/08 ,  G06F18/214 ,  G06F18/2431 ,  G06F18/2413 ,  G06V10/42 ,  G06V10/764 ,  G06V10/774 ,  G06V10/82

CPC classification number: G06T7/001 ,  G01N21/8851 ,  G06F18/214 ,  G06F18/2431 ,  G06F18/24133 ,  G06N3/08 ,  G06T7/0004 ,  G06T7/11 ,  G06T7/136 ,  G06T7/70 ,  G06V10/431 ,  G06V10/764 ,  G06V10/774 ,  G06V10/82 ,  G01N2021/8854 ,  G01N2021/8887 ,  G06T2207/20021 ,  G06T2207/20081 ,  G06T2207/20084

Abstract: A product defect detection method, device and system are disclosed. The product defect detection method comprises: constructing a defect detection framework including a classification network, a locating detection network and a judgment network; training the classification network by using a sample image of a product containing different defect types to obtain a classification network capable of classifying the defect types existing in the sample image; training the locating detection network by using a sample image of a product containing different defect types to obtain a locating detection network capable of locating a position of each type of defect in the sample image; inputting an acquired product image into the defect detection framework, inputting a classification result and a detection result obtained into the judgment network to judge whether the product has a defect, and detecting a defect type and a defect position when the product has a defect.