Methods, apparatus, systems and articles of manufacture are disclosed to manage process excursions. An example apparatus includes a digital twin comparer to determine when a product fails to satisfy a tolerance metric of a digital twin, and a fingerprint manager to generate a fingerprint corresponding to a sensor pattern. The example apparatus also includes a node interfacer to determine a number of workstations of a process control system that exhibit the fingerprint, and an excursion statistics calculator to invoke a corrective action for respective ones of the number of workstations, the corrective action based on a threshold count of the number of workstations that exhibit the fingerprint.