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429 条记录 (耗时 0.026 秒)

    Diagnosis device
    1.
    发明授权
    Diagnosis device 有权

    公开(公告)号：US11474082B2

    公开(公告)日：2022-10-18

    申请号：US16373920

    申请日：2019-04-03

    申请人： SUBARU CORPORATION

    发明人： Hideki Soejima

    IPC分类号： G01N29/44 ,  G01H9/00 ,  G01N29/04 ,  G07C3/14 ,  G01M11/08 ,  G01M5/00 ,  G01K11/32

    摘要： A diagnosis device includes a data acquirer, a data recorder, and a health diagnoser. The data acquirer acquires a measurement data of a structure at a predetermined timing. The data recorder causes a storage to store the measurement data acquired by the data acquirer as a standard data. The health diagnoser diagnoses a health of the structure by comparing the measurement data that is acquired by the data acquirer this time with the standard data that has been acquired by the data acquirer last time and stored in the storage.

    System and method for mechanical transmission control
    3.
    发明授权
    System and method for mechanical transmission control 有权

    公开(公告)号：US11099531B2

    公开(公告)日：2021-08-24

    申请号：US15941064

    申请日：2018-03-30

    申请人： GENERAL ELECTRIC COMPANY

    发明人： Prabhakar Neti ,  Karim Younsi ,  Deepak Aravind ,  Xu Han

    IPC分类号： G05B13/04 ,  G05B23/02 ,  G07C3/14 ,  G06N20/00

    摘要： A method of controlling an operation of a mechanical transmission system includes receiving motor-load data corresponding to the mechanical transmission system. The method further includes receiving, by a digital motor unit, one or more motor input parameters and generating motor parameter estimates of one or more of the plurality of motor parameters. The method also includes receiving, by a digital load unit, one or more motor parameter estimates from the digital motor unit and generating load parameter estimates corresponding to one or more load parameters. The digital motor unit and the digital load unit is a real-time operational model of the motor unit and the load unit respectively. The method also includes controlling the operation of the mechanical transmission system based on one or more of the motor-load data, motor parameter estimates and load parameter estimates.

    Performance Parameterization of Process Equipment and Systems
    7.
    发明申请
    Performance Parameterization of Process Equipment and Systems 审中-公开

    公开(公告)号：US20200326089A1

    公开(公告)日：2020-10-15

    申请号：US16464568

    申请日：2016-12-02

    申请人： S.A. Armstrong Limited

    发明人： Olatunji ASIWAJU ,  Peter THOMSEN

    IPC分类号： F24F11/49 ,  G07C3/08 ,  G07C3/14

    摘要： Performance mapping of equipment performance parameters by capturing, mapping, and/or structuralizing equipment performance data of a device for installation in a system. This includes generating performance maps which outline the expected feature performance parameter behavior of the equipment based on a set of operating parameters that capture the operating conditions. Each performance parameter on the map is representative of an operating point of specific operating conditions taken at a particular point in time. In one example, a performance parameter can be defined by an individualized set of parameter coefficients which in turn are dependent on instantaneous operating conditions. With the performance maps determined individually for devices as part of the system, and stored along with a time of testing, activities such as continuous commissioning, monitoring and verification, preventative maintenance, fault detection and diagnostics, as well as energy performance benchmarking and long term monitoring can be performed.

    Methods and systems for inline parts average testing and latent reliability defect detection
    8.
    发明授权
    Methods and systems for inline parts average testing and latent reliability defect detection 有权

    公开(公告)号：US10761128B2

    公开(公告)日：2020-09-01

    申请号：US15480244

    申请日：2017-04-05

    申请人： KLA-Tencor Corporation

    发明人： David W. Price ,  Robert J. Rathert ,  Robert Cappel ,  Kara L. Sherman ,  Douglas G. Sutherland

    IPC分类号： G01R31/26 ,  G07C3/14 ,  G01R31/28 ,  G06F17/18

    摘要： Methods and systems for inline parts average testing and latent reliability defect recognition or detection are disclosed. An inline parts average testing method may include: performing inline inspection and metrology on a plurality of wafers at a plurality of critical steps during wafer fabrication; aggregating inspection results obtained from inline inspection and metrology utilizing one or more processors to obtain a plurality of aggregated inspection results for the plurality of wafers; identifying one or more statistical outliers among the plurality of wafers at least partially based on the plurality of aggregated inspection results obtained for the plurality of wafers; and disqualifying the one or more statistical outliers from entering a supply chain for a downstream manufacturing process, or segregating the one or more statistical outliers for further evaluation, testing or repurposing.