Invention Grant
- Patent Title: Liveness test method and liveness test apparatus
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Application No.: US16924544Application Date: 2020-07-09
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Publication No.: US11776239B2Publication Date: 2023-10-03
- Inventor: Seungju Han , Byung Kwan Kim , Jong-Sok Kim , Sungdo Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR 20190165777 2019.12.12
- Main IPC: G01S7/41
- IPC: G01S7/41 ; G01S7/02 ; G01S13/04 ; G01S13/86 ; G06V40/16 ; G06V10/764 ; G06V10/82 ; G06V40/40

Abstract:
Disclosed is a liveness test method and liveness test apparatus. The liveness test method includes determining a presence of a subject using a radar sensor, performing a first liveness test on the subject based on radar data obtained by the radar sensor, in response to the subject being present, acquiring image data of the subject using an image sensor, in response to a result of the first liveness test satisfying a first condition, and performing a second liveness test on the subject based on the image data.
Public/Granted literature
- US20210181305A1 LIVENESS TEST METHOD AND LIVENESS TEST APPARATUS Public/Granted day:2021-06-17
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