Invention Grant
- Patent Title: Fault detection circuit for image sensor
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Application No.: US17183866Application Date: 2021-02-24
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Publication No.: US11778134B2Publication Date: 2023-10-03
- Inventor: Willem J. Kindt , Hui-Yu Chen
- Applicant: Teledyne DALSA B.V.
- Applicant Address: NL Eindhoven
- Assignee: TELEDYNE DALSA B.V.
- Current Assignee: TELEDYNE DALSA B.V.
- Current Assignee Address: NL Eindhoven
- Agency: K&L Gates LLP
- Priority: EP 173502 2020.05.07
- Main IPC: G01R31/52
- IPC: G01R31/52 ; H04N5/32 ; G01R31/54 ; G01R31/28

Abstract:
The present invention relates to a fault detection circuit for detecting one or more column faults in a pixel array of an image sensor. The present invention further relates to a readout circuit for reading out a column line of an image sensor, and to an image sensor comprising the same.
The fault detection circuit according to the invention comprises a signal unit for applying an electrical signal to a given column line of the pixel array, a determining unit for measuring a response to the applied electrical signal and for determining whether a fault exists for said given column line in dependence of the measured response, and a controller for controlling the signal unit and the determining unit, and for outputting a fault status for said given column line.
The fault detection circuit according to the invention comprises a signal unit for applying an electrical signal to a given column line of the pixel array, a determining unit for measuring a response to the applied electrical signal and for determining whether a fault exists for said given column line in dependence of the measured response, and a controller for controlling the signal unit and the determining unit, and for outputting a fault status for said given column line.
Public/Granted literature
- US20210352224A1 FAULT DETECTION CIRCUIT FOR IMAGE SENSOR Public/Granted day:2021-11-11
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