- Patent Title: Etching composition, a method of etching a metal barrier layer and a metal layer using the same, and method of manufacturing semiconductor device using the same
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Application No.: US17313534Application Date: 2021-05-06
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Publication No.: US11795550B2Publication Date: 2023-10-24
- Inventor: Jungah Kim , Mihyun Park , Jinwoo Lee , Keonyoung Kim , Hyosan Lee , Hoon Han , Jin Uk Lee , Jung Hun Lim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.,SOULBRAIN CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.,SOULBRAIN CO., LTD.
- Current Assignee Address: KR Suwon-si; KR Seongnam-si
- Agency: Sughrue Mion, PLLC
- Priority: KR 20180111342 2018.09.18
- Main IPC: C23F1/26
- IPC: C23F1/26 ; C23F1/30 ; H01L21/311 ; H01L21/306 ; B81C1/00 ; C09K13/04

Abstract:
A method of etching a metal barrier layer and a metal layer is provided. The method includes forming the metal barrier layer and the metal layer on a substrate, and using an etching composition to etch the metal barrier layer and the metal layer. The etching composition may include an oxidant selected from nitric acid, bromic acid, iodic acid, perchloric acid, perbromic acid, periodic acid, sulfuric acid, methane sulfonic acid, p-toluenesulfonic acid, benzenesulfonic acid, or a combination thereof, a metal etching inhibitor including a compound expressed by Chemical Formula 1, and a metal oxide solubilizer selected from phosphoric acid, phosphate, carboxylic acid having 3 to 20 carbon atoms, or a combination thereof.
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