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公开(公告)号:US20230118554A1
公开(公告)日:2023-04-20
申请号:US17674579
申请日:2022-02-17
发明人: Paul Abel
IPC分类号: C23F1/30
摘要: The present disclosure provides a new wet atomic layer etch (ALE) process for etching ruthenium. More specifically, the present disclosure provides various embodiments of methods that utilize new etch chemistries for etching ruthenium in a wet ALE process. Unlike conventional etch processes for ruthenium, the wet ALE process described herein for etching ruthenium is metal-free, cost-effective and improves surface roughness during etching.
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公开(公告)号:US11456412B2
公开(公告)日:2022-09-27
申请号:US16890505
申请日:2020-06-02
申请人: FUJIFILM CORPORATION
发明人: Keeyoung Park , Atsushi Mizutani
IPC分类号: H01L43/12 , H01L21/3065 , H01L21/308 , H01L43/08 , H01L27/105 , C23F1/40 , C23F4/00 , C23F1/30
摘要: A treatment liquid contains orthoperiodic acid and water, and the pH is 11 or more. It is preferable that the content of orthoperiodic acid in the treatment liquid is 0.01% to 5% by mass with respect to the total mass of the treatment liquid.
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公开(公告)号:US11441229B2
公开(公告)日:2022-09-13
申请号:US16444262
申请日:2019-06-18
申请人: ENTEGRIS, INC.
发明人: SeongJin Hong
IPC分类号: C23F1/30 , H01L21/4757 , H01L21/306 , H01L21/3213
摘要: A method of selectively removing NiPt material from a microelectronic substrate, the method comprising contacting the NiPt material with an aqueous etching composition comprising: an oxidising agent; a strong acid; and a source of chloride.
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公开(公告)号:US11384437B2
公开(公告)日:2022-07-12
申请号:US16854342
申请日:2020-04-21
发明人: Jong Hee Park , Jin Seock Kim , Bong Won Lee , Sang-woo Kim , Il-Ryong Park , Bong-Yeon Won , Dae-woo Lee
IPC分类号: C09K13/06 , C23F1/16 , C23F1/30 , H01L21/3213 , C23F1/02 , H05K3/06 , H01L27/12 , H01L29/786
摘要: A phosphoric acid-free etchant composition and a method of forming a wiring, the composition including about 40 wt % to about 60 wt % of an organic acid compound; about 6 wt % to about 12 wt % of a glycol compound; about 1 wt % to about 10 wt % of nitric acid, sulfuric acid, or hydrochloric acid; about 1 wt % to about 10 wt % of a nitrate salt compound; and water, all wt % being based on a total weight of the phosphoric acid-free etchant composition.
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公开(公告)号:US20220205111A1
公开(公告)日:2022-06-30
申请号:US17644248
申请日:2021-12-14
发明人: Yukihisa WADA , Kazuhiro TAKAHASHI
IPC分类号: C23F1/30 , H01L21/311
摘要: A method for producing a semiconductor element and a chemical solution to be used in the method for producing a semiconductor element, the method including dry-etching or chemically-mechanically polishing a ruthenium-containing layer located as an uppermost layer of a substrate; and bringing a surface of the substrate into contact with a chemical solution thereby satisfactorily cleaning and removing a ruthenium residue formed on the surface of the substrate; and a chemical solution to be suitably used in the method for producing a semiconductor element.
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公开(公告)号:US20210242029A1
公开(公告)日:2021-08-05
申请号:US17234833
申请日:2021-04-20
发明人: Sebastian Meier , Helmut Rinck
IPC分类号: H01L21/306 , H01L21/308 , C23F1/44 , C23F1/30 , H01L21/24
摘要: There is provided a method of patterning platinum on a substrate. A platinum layer is deposited on the substrate, and a patterned photoresist layer is formed over the platinum layer leaving partly exposed regions of the platinum layer. An aluminum layer is deposited over the partly exposed regions of the platinum layer. An alloy is formed of aluminum with platinum from the partly exposed regions. The platinum aluminum alloy is etched away leaving a remaining portion of the platinum layer to form a patterned platinum layer on the substrate. In an embodiment, a thin hard mask layer is deposited on the platinum layer on the semiconductor substrate before the patterned photoresist layer is formed.
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公开(公告)号:US20210175093A1
公开(公告)日:2021-06-10
申请号:US17104086
申请日:2020-11-25
发明人: Taisei Inoue , Hiroki Sakurai , Takashi Nakazawa
IPC分类号: H01L21/3213 , C23F1/30 , H01L21/67
摘要: A substrate processing apparatus includes a temperature detector, a calculation unit and an execution unit. The temperature detector is configured to detect a temperature of a substrate on which a processing liquid is discharged. The calculation unit is configured to calculate, by using a given calculation formula, an etching amount of the substrate based on the temperature detected by the temperature detector. The execution unit configured to perform an etching processing on the substrate by the processing liquid based on the etching amount.
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公开(公告)号:US10968523B1
公开(公告)日:2021-04-06
申请号:US16120197
申请日:2018-08-31
申请人: ELECTRIC MIRROR, LLC
摘要: A method to partially decrease a reflectivity of a region on a mirror platform includes isolating the region on a surface of the mirror platform and removing a first material from the surface of the mirror platform within the region. The reflectivity of the mirror platform is decreased within the region.
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公开(公告)号:US10923514B2
公开(公告)日:2021-02-16
申请号:US16217563
申请日:2018-12-12
申请人: Patrick Hogan , John Moore , Alex Brewer , Jared Pettit
发明人: Patrick Hogan , John Moore , Alex Brewer , Jared Pettit
IPC分类号: H01L21/3205 , C23F1/16 , H01L27/12 , C23F1/02 , H01L29/66 , H01L21/283 , H01L29/49 , H01L29/423 , H01L29/786 , H01L21/3213 , C23F1/18 , C23F1/26 , C23F1/30 , H01L29/417 , G02F1/1343 , G02F1/1368
摘要: In various embodiments, etchants featuring (i) mixtures of hydrochloric acid, methanesulfonic acid, and nitric acid, or (ii) mixtures of phosphoric acid, methanesulfonic acid, and nitric acid, are utilized to etch metallic bilayers while minimizing resulting etch discontinuities between the layers of the bilayer.
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公开(公告)号:US20190255317A1
公开(公告)日:2019-08-22
申请号:US16278275
申请日:2019-02-18
发明人: Christiane Leitold , Oliver Keitel , Hoang-Minh LE , Jörg Krenzer
摘要: One aspect relates to a production method for a ring electrode, to a ring electrode, and to an electrode system. One method for the ring electrode includes providing an outer element, including an outer tube, providing a first inner element, including a first inner tube having a first core of a sacrificial material, providing a second inner element, including a second core of a sacrificial material, forming a composite tube by arranging the first inner element and the second inner element inside the outer element, the first inner element and the second inner element being arranged off-center with respect to one another, drawing the composite tube in a longitudinal direction of the composite tube, separating a composite tube disk from the composite tube, removing the sacrificial material of the first core, and removing the sacrificial material of the second core in order to obtain a contacting opening in the ring electrode.
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