- 专利标题: Single-crystal x-ray structure analysis apparatus and method, and sample holder unit therefor
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申请号: US17295855申请日: 2019-11-21
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公开(公告)号: US11802844B2公开(公告)日: 2023-10-31
- 发明人: Takashi Sato
- 申请人: Rigaku Corporation
- 申请人地址: JP Tokyo
- 专利权人: Rigaku Corporation
- 当前专利权人: Rigaku Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: ASLAN LAW, P.C.
- 优先权: JP 18217815 2018.11.21
- 国际申请: PCT/JP2019/045686 2019.11.21
- 国际公布: WO2020/105717A 2020.05.28
- 进入国家日期: 2021-05-20
- 主分类号: G01N23/207
- IPC分类号: G01N23/207 ; G01N23/20025 ; G01N1/28 ; G01N23/20016
摘要:
A single-crystal X-ray structure analysis apparatus capable of surely and easily performing a single-crystal X-ray structure analysis using a crystalline sponge, and an analysis method and a sample holder unit thereof are provided. There are provided a sample holder that holds a sample; a goniometer that rotationally moves, the sample holder 250 being attached to the goniometer; an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder 250 attached to the goniometer, wherein the sample holder 250 comprises a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein, and the applicator comprises a space for soaking the sample in the porous complex crystal of the sample holder 250.
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