- 专利标题: Layout structures of memory array and related methods
-
申请号: US17567705申请日: 2022-01-03
-
公开(公告)号: US11842781B2公开(公告)日: 2023-12-12
- 发明人: Meng-Sheng Chang , Yao-Jen Yang , Shao-Yu Chou , Yih Wang
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: WPAT LAW
- 代理商 Anthony King
- 主分类号: G11C17/16
- IPC分类号: G11C17/16 ; G11C7/24 ; G11C8/14 ; G11C17/18 ; G06F21/79 ; G06F12/14
摘要:
A layout method includes: forming a layout structure of a memory array having first and second rows, each including a plurality of storage cells, wherein at least one of the storage cells includes a fuse; disposing a word line between the first and second rows; disposing a plurality of control electrodes across the word line for connecting the storage cells of the first row and the storage cells of the second row respectively; disposing a first cut layer on a first control electrode of the control electrodes located on a first side of the word line; and disposing a second cut layer on a second control electrode of the control electrodes located on a second side of the word line; wherein the first side of the word line is opposite to the second side of the word line.
公开/授权文献
- US20220122681A1 LAYOUT STRUCTURES OF MEMORY ARRAY AND RELATED METHODS 公开/授权日:2022-04-21
信息查询