Invention Grant
- Patent Title: Estimation model generation method and electron microscope
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Application No.: US17671896Application Date: 2022-02-15
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Publication No.: US11842880B2Publication Date: 2023-12-12
- Inventor: Ryusuke Sagawa , Shigeyuki Morishita , Fuminori Uematsu , Tomohiro Nakamichi , Keito Aibara
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: THE WEBB LAW FIRM
- Priority: JP 21022197 2021.02.16
- Main IPC: H01J37/153
- IPC: H01J37/153 ; H01J37/26 ; H01J37/28

Abstract:
An aberration value estimator has a learned estimation model for estimating an aberration value set based on a Ronchigram. In a machine learning sub-system, a simulation is repeatedly executed while changing a simulation condition, and calculated Ronchigrams are generated in a wide variety and in a large number. By machine learning using the calculated Ronchigrams, the learned estimation model is generated.
Public/Granted literature
- US20220262595A1 Estimation Model Generation Method and Electron Microscope Public/Granted day:2022-08-18
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