• 专利标题: Single-crystal X-ray structure analysis apparatus, and method therefor
  • 申请号: US17295859
    申请日: 2019-11-21
  • 公开(公告)号: US11874204B2
    公开(公告)日: 2024-01-16
  • 发明人: Takashi Sato
  • 申请人: Rigaku Corporation
  • 申请人地址: JP Tokyo
  • 专利权人: Rigaku Corporation
  • 当前专利权人: Rigaku Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: ASLAN LAW, P.C.
  • 优先权: JP 18218733 2018.11.22
  • 国际申请: PCT/JP2019/045691 2019.11.21
  • 国际公布: WO2020/105722A 2020.05.28
  • 进入国家日期: 2021-05-20
  • 主分类号: G01N1/28
  • IPC分类号: G01N1/28 G01N23/207 G01N23/20025
Single-crystal X-ray structure analysis apparatus, and method therefor
摘要:
A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.
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