Invention Grant
- Patent Title: Power amplifiers testing system and related testing method
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Application No.: US17818141Application Date: 2022-08-08
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Publication No.: US11906598B2Publication Date: 2024-02-20
- Inventor: Hsieh-Hung Hsieh , Wu-Chen Lin , Yen-Jen Chen , Tzu-Jin Yeh
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT LAW
- Agent Anthony King
- Main IPC: G01R31/40
- IPC: G01R31/40 ; H03F3/21 ; G01R29/08 ; H03F3/24
Abstract:
A testing system includes: a dividing circuit configured to receive a testing signal and provide a plurality of input signals according to the testing signal; and a plurality of power-amplifier chips coupled to the dividing circuit, each of the plurality of power-amplifier chips being configured to be tested by receiving a respective input signal of the plurality of input signals and generating a respective output signal for a predetermined testing time.
Public/Granted literature
- US20220381808A1 POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD Public/Granted day:2022-12-01
Information query
