Invention Grant
- Patent Title: Inspection apparatus and inspection method
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Application No.: US17286959Application Date: 2019-10-17
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Publication No.: US11940485B2Publication Date: 2024-03-26
- Inventor: Naoki Akiyama , Susumu Saito , Hiroyuki Nakayama , Shigeru Kasai
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JP 18201073 2018.10.25
- International Application: PCT/JP2019/040936 2019.10.17
- International Announcement: WO2020/085203A 2020.04.30
- Date entered country: 2021-04-20
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R1/067 ; G01R1/073 ; H01L27/146

Abstract:
In an inspection apparatus for inspecting an inspection target device formed on an inspection object, the inspection target device is a back-illuminated imaging device into which light is incident from a rear surface opposite to a side of a wiring layer. The inspection apparatus includes a stage having the inspection object placed such that the inspection object faces the rear surface. The stage includes a light transmitter made of a light-transmissive material. The inspection object is placed on the light transmitter below which a light illuminator is disposed. The light illuminator includes a flat light guide plate having a facing surface facing the inspection object. A light source is provided laterally outside the light guide plate configured to diffuse light emitted from the light source incident from a side end surface of the light guide plate, and to emit the light as planar light from the facing surface.
Public/Granted literature
- US20210389366A1 INSPECTION APPARATUS AND INSPECTION METHOD Public/Granted day:2021-12-16
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