- 专利标题: Gas analysis device and method for detecting sample gas
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申请号: US17806805申请日: 2022-06-14
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公开(公告)号: US11994492B2公开(公告)日: 2024-05-28
- 发明人: Yan Wang , Qingjun Zhang , Yuanjing Li , Zhiqiang Chen , Jianmin Li , Yaohong Liu , Ge Li , Zhongyuan Hao , Nei Yang , Guangqin Li
- 申请人: Nuctech Company Limited
- 申请人地址: CN Beijing
- 专利权人: Nuctech Company Limited
- 当前专利权人: Nuctech Company Limited
- 当前专利权人地址: CN Beijing
- 代理机构: Schwegman Lundberg & Woessner, P.A.
- 优先权: CN 2110674647.2 2021.06.17
- 主分类号: H01J49/42
- IPC分类号: H01J49/42 ; G01N27/623 ; H01J49/00 ; H01J49/06
摘要:
The present disclosure provides a gas analysis device and a method for detecting sample gas. The gas analysis device includes: an ion mobility spectrometer including an ion mobility tube, an ion gate, a plurality of electrodes, a suppression grid, and a Faraday plate sequentially disposed in the ion mobility tube, wherein the Faraday plate is configured to receive sample ions discharged from the suppression grid, and the Faraday plate is provided with a through hole; a mass spectrometer; a gate valve disposed between the Faraday plate and an ion inlet of the mass spectrometer; and a controller configured to control an opening or closing of the gate valve to allow the sample ions discharged from the suppression grid to flow into the mass spectrometer through the through hole of the Faraday plate when the gate valve is opened.
公开/授权文献
- US20220404312A1 GAS ANALYSIS DEVICE AND METHOD FOR DETECTING SAMPLE GAS 公开/授权日:2022-12-22
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