- 专利标题: Location dependent sense time offset parameter for improvement to the threshold voltage distribution margin in non-volatile memory structures
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申请号: US17554321申请日: 2021-12-17
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公开(公告)号: US12027218B2公开(公告)日: 2024-07-02
- 发明人: Xue Bai Pitner , Prafful Golani , Ravi Kumar
- 申请人: SanDisk Technologies LLC
- 申请人地址: US TX Addison
- 专利权人: SanDisk Technologies LLC
- 当前专利权人: SanDisk Technologies LLC
- 当前专利权人地址: US TX Addison
- 代理机构: Dickinson Wright PLLC
- 代理商 Steven C. Hurles
- 主分类号: G11C16/04
- IPC分类号: G11C16/04 ; G11C16/34 ; G11C16/26 ; H10B41/27 ; H10B43/27
摘要:
A method for performing a program verify operation with respect to a target memory cell in a memory structure of a non-volatile memory system is provided. The method may include the step of determining a location of the target memory cell within the structure and, based upon the determined location of the target cell and with respect to each programmable memory state: (1) applying a first sense signal at a first point in time, and (2) applying a second sense signal at a second point in time. A time interval between the first and the second points in time is equal to a predetermined optimal time period plus or minus an offset parameter time value.
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