- 专利标题: Device for alignment of two substrates
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申请号: US17741789申请日: 2022-05-11
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公开(公告)号: US12027383B2公开(公告)日: 2024-07-02
- 发明人: Daniel Figura
- 申请人: EV GROUP E. THALLNER GMBH
- 申请人地址: AT St. Florian am Inn
- 专利权人: EV GROUP E. THALLNER GMBH
- 当前专利权人: EV GROUP E. THALLNER GMBH
- 当前专利权人地址: AT St. Florian am Inn
- 代理机构: KUSNER & JAFFE
- 优先权: EP 012023 2009.09.22
- 主分类号: H01L21/68
- IPC分类号: H01L21/68 ; H01L21/67
摘要:
A device and method for alignment of a first contact surface of a first substrate with a second contact surface of a second substrate which can be held on a second platform includes first X-Y positions of first alignment keys located along the first contact surface, and second X-Y positions of second alignment keys which correspond to the first alignment keys and which are located along the second contact surface. The first contact surface can be aligned based on the first X-Y positions in the first alignment position and the second contact surface can be aligned based on the second X-Y positions in the second alignment position.
公开/授权文献
- US20220270896A1 DEVICE FOR ALIGNMENT OF TWO SUBSTRATES 公开/授权日:2022-08-25
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