- 专利标题： Testing device and method for testing a device under test
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申请号： US17722219申请日： 2022-04-15
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公开(公告)号： US12032001B2公开(公告)日： 2024-07-09
- 发明人: Jia Jin Lin , Chia Hsiang Wang , Shih Pin Chung , Wei Shuo Chu , You Lin Lee , Pin Heng Kuo , Cheng Chia Tu
- 申请人： Advanced Semiconductor Engineering, Inc. , ASE TEST, INC.
- 申请人地址： TW Kaohsiung
- 专利权人： ADVANCED SEMICONDUCTOR ENGINEERING, INC.,ASE TEST, INC.
- 当前专利权人： ADVANCED SEMICONDUCTOR ENGINEERING, INC.,ASE TEST, INC.
- 当前专利权人地址： TW Kaohsiung; TW Kaohsiung
- 代理机构： FOLEY & LARDNER LLP
- 主分类号： G01R31/26
- IPC分类号： G01R31/26 ; G01R1/04 ; G01R31/28
摘要：
A testing device is disclosed. The testing device includes a socket configured to support a DUT and a first detection module disposed at a first side of the socket and configured to detect a location relationship between the DUT and the socket.
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