专利检索 ap:("Advanced Semiconductor Engineering, Inc." OR "ASE TEST, INC.") AND inv:"Cheng Chia Tu" 第 1 页

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发明授权
Testing device and method for testing a device under test 有权

公开(公告)号：US12032001B2

公开(公告)日：2024-07-09

申请号：US17722219

申请日：2022-04-15

申请人： Advanced Semiconductor Engineering, Inc. , ASE TEST, INC.

发明人： Jia Jin Lin , Chia Hsiang Wang , Shih Pin Chung , Wei Shuo Chu , You Lin Lee , Pin Heng Kuo , Cheng Chia Tu

IPC分类号： G01R31/26 , G01R1/04 , G01R31/28

CPC分类号： G01R1/0466 , G01R31/2863

摘要： A testing device is disclosed. The testing device includes a socket configured to support a DUT and a first detection module disposed at a first side of the socket and configured to detect a location relationship between the DUT and the socket.