- 专利标题: Contact quality assessment by dielectric property analysis
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申请号: US17180947申请日: 2021-02-22
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公开(公告)号: US12048594B2公开(公告)日: 2024-07-30
- 发明人: Yitzhack Schwartz , Eli Dichterman , Adi Rabinovich
- 申请人: Navix International Limited
- 申请人地址: VG Road Town
- 专利权人: Navix International Limited
- 当前专利权人: Navix International Limited
- 当前专利权人地址: VG Road Town
- 主分类号: A61B18/14
- IPC分类号: A61B18/14 ; A61B5/00 ; A61B5/0538 ; A61B5/06 ; A61B34/10 ; A61B34/20 ; A61B90/00 ; G06F30/00 ; G06F30/20 ; G16H10/60 ; G16H30/20 ; G16H50/50 ; A61B17/00 ; A61B18/00 ; A61M25/01 ; G01H17/00 ; G06F17/18 ; H02K7/18
摘要:
Devices and methods for assessing tissue contact based on dielectric properties and/or impedance sensing are disclosed. In some embodiments, one or more probing frequencies are delivered via electrodes including an electrode in proximity to a tissue (for example, myocardial tissue). In some embodiments, dielectric parameter values, optionally together with other known and/or estimated tissue characteristics, are measured to determine a contact quality with the tissue. In some embodiments, dielectric contact quality is used, for example, in guiding the formation of a lesion (for example, RF ablation of heart tissue to alter electrical transmission characteristics).
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