- 专利标题: Method for manufacturing semiconductor device
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申请号: US17815242申请日: 2022-07-27
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公开(公告)号: US12074110B2公开(公告)日: 2024-08-27
- 发明人: Ching-Kai Shen , Yi-Chuan Teng , Wei-Chu Lin , Hung-Wei Liang , Jung-Kuo Tu
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: WPAT LAW
- 代理商 Anthony King
- 分案原申请号: US16426543 2019.05.30
- 主分类号: H01L23/532
- IPC分类号: H01L23/532 ; H01L21/768 ; H01L23/31 ; H01L23/34 ; H01L23/48
摘要:
A method for forming a semiconductor device includes receiving a first bonded to a second substrate by a dielectric layer, wherein a conductive layer is disposed in the dielectric layer and a cavity is formed between the first substrate, the second substrate and the dielectric layer; forming a via opening in the second substrate to expose the conductive layer and a vent hole in the substrate to couple to the cavity; forming a first buffer layer covering sidewalls of the via opening and a second buffer layer covering sidewalls of the vent hole; and forming a connecting structure in the via opening and a sealing structure to seal the vent hole.
公开/授权文献
- US20220367378A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE 公开/授权日:2022-11-17
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