Invention Grant
- Patent Title: Method of inspecting display device and method of manufacturing display device
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Application No.: US17445378Application Date: 2021-08-18
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Publication No.: US12087645B2Publication Date: 2024-09-10
- Inventor: Seung Kyu Lee , Ki Pyo Hong
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: KR 20200150123 2020.11.11
- Main IPC: H01L21/66
- IPC: H01L21/66 ; G01R31/26 ; G01R31/54 ; H01L25/16

Abstract:
A method of inspecting a display device and a method of manufacturing a display device are provided. The display includes a substrate, a light emitting element on the substrate, a first contact electrode on one end of the light emitting element, and a second contact electrode spaced from the first contact electrode and on an other end of the light emitting element. The method of inspecting the display device includes applying a first inspection voltage and a second inspection voltage to the first contact electrode and the second contact electrode, respectively, and measuring a first inspection current, and while applying the first inspection voltage and the second inspection voltage to the first contact electrode and the second contact electrode, respectively, irradiating the light emitting element with inspection light and measuring a second inspection current.
Public/Granted literature
- US20220148926A1 METHOD OF INSPECTING DISPLAY DEVICE AND METHOD OF MANUFACTURING DISPLAY DEVICE Public/Granted day:2022-05-12
Information query
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