Invention Grant
- Patent Title: Magnetic random access memory device and method for fabricating the same
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Application No.: US17361331Application Date: 2021-06-29
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Publication No.: US12089504B2Publication Date: 2024-09-10
- Inventor: Yen-Tsai Yi , Wei-Chuan Tsai , Jin-Yan Chiou , Hsiang-Wen Ke
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: CN 2110599237.6 2021.05.31
- Main IPC: H10N50/80
- IPC: H10N50/80 ; H10B61/00 ; H10N50/01

Abstract:
A method for fabricating a magnetic random access memory (MRAM) device includes the steps of first forming a magnetic tunneling junction (MTJ) stack on a substrate, forming a first top electrode on the MTJ stack, and then forming a second top electrode on the first top electrode. Preferably, the first top electrode includes a gradient concentration while the second top electrode includes a non-gradient concentration.
Public/Granted literature
- US20220384710A1 MAGNETIC RANDOM ACCESS MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2022-12-01
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