- 专利标题: P-type CZT radiation detector for high flux applications
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申请号: US17807957申请日: 2022-06-21
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公开(公告)号: US12094988B1公开(公告)日: 2024-09-17
- 发明人: James Balcom , Jason MacKenzie , Francis Joseph Kumar , Krzysztof Iniewski , Michael K. Jackson , Yuxin Song
- 申请人: REDLEN TECHNOLOGIES, INC.
- 申请人地址: CA Saanichton
- 专利权人: REDLEN TECHNOLOGIES, INC.
- 当前专利权人: REDLEN TECHNOLOGIES, INC.
- 当前专利权人地址: CA Saanichton
- 代理机构: THE MARBURY LAW GROUP PLLC
- 主分类号: H01L31/0272
- IPC分类号: H01L31/0272 ; H01L31/0288 ; H01L31/08 ; H01L31/109
摘要:
An ionizing radiation detector includes a p-type semiconductor single crystal substrate having first and second major planar opposing surfaces, where the p-type semiconductor single crystal substrate is doped with n-type dopant atoms, and where a concentration of deep level acceptor defects is greater than a concentration of the n-type dopant atoms in the p-type semiconductor single crystal substrate; a cathode electrode on the first major planar opposing surface of the p-type semiconductor single crystal substrate, and a plurality of anode electrodes on the second major planar opposing surface of the p-type semiconductor single crystal substrate.
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