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公开(公告)号:US12046623B2
公开(公告)日:2024-07-23
申请号:US17395794
申请日:2021-08-06
IPC分类号: H01L31/00 , A61B6/03 , H01L27/146
CPC分类号: H01L27/14659 , A61B6/032 , H01L27/14696 , H01L27/14698
摘要: A radiation detector tile includes a single crystal compound semiconductor tile having a zinc blende crystal structure, a (111) plane first major (i.e. prominent) surface and four side surfaces which are rotated by an angle of 13° to 17° to a {110} family of planes. The tile may be formed by dicing a (111) oriented wafer at directions which are rotated by an angle of 13° to 17° from in-plane slipping directions to reduce or eliminate the side surface chipping and sub surface dislocation defects.
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公开(公告)号:US12094988B1
公开(公告)日:2024-09-17
申请号:US17807957
申请日:2022-06-21
发明人: James Balcom , Jason MacKenzie , Francis Joseph Kumar , Krzysztof Iniewski , Michael K. Jackson , Yuxin Song
IPC分类号: H01L31/0272 , H01L31/0288 , H01L31/08 , H01L31/109
CPC分类号: H01L31/0272 , H01L31/0288 , H01L31/085 , H01L31/109
摘要: An ionizing radiation detector includes a p-type semiconductor single crystal substrate having first and second major planar opposing surfaces, where the p-type semiconductor single crystal substrate is doped with n-type dopant atoms, and where a concentration of deep level acceptor defects is greater than a concentration of the n-type dopant atoms in the p-type semiconductor single crystal substrate; a cathode electrode on the first major planar opposing surface of the p-type semiconductor single crystal substrate, and a plurality of anode electrodes on the second major planar opposing surface of the p-type semiconductor single crystal substrate.
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公开(公告)号:US11733408B2
公开(公告)日:2023-08-22
申请号:US17225416
申请日:2021-04-08
IPC分类号: G01T1/29 , H01L27/146
CPC分类号: G01T1/2928 , H01L27/1463 , H01L27/14658 , H01L27/14696
摘要: A radiation detector includes a semiconductor layer having opposing first and second surfaces, anodes disposed over the first surface of the semiconductor layer in a pixel pattern, a cathode disposed over the second surface of the semiconductor layer, and an electrically conductive pattern disposed over the first surface of the semiconductor layer in interpixel gaps between the anodes. At least a portion of the electrically conductive pattern is not electrically connected to an external bias source.
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公开(公告)号:US11378701B2
公开(公告)日:2022-07-05
申请号:US17064089
申请日:2020-10-06
发明人: Saeid Taherion , Michael K. Jackson
IPC分类号: G01T1/24 , H01L27/146 , H01L31/09 , G01T1/17
摘要: A radiation sensor includes a radiation-sensitive semiconductor layer, a cathode electrode disposed over a front side of the radiation-sensitive semiconductor layer that is configured to be exposed to radiation, at least one anode electrode disposed over a backside of the radiation-sensitive semiconductor layer, and a potential barrier layer located between the cathode electrode and the front side of the radiation-sensitive semiconductor layer.
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公开(公告)号:US20220107431A1
公开(公告)日:2022-04-07
申请号:US17064089
申请日:2020-10-06
发明人: Saeid TAHERION , Michael K. Jackson
IPC分类号: G01T1/24 , H01L27/146
摘要: A radiation sensor includes a radiation-sensitive semiconductor layer, a cathode electrode disposed over a front side of the radiation-sensitive semiconductor layer that is configured to be exposed to radiation, at least one anode electrode disposed over a backside of the radiation-sensitive semiconductor layer, and a potential barrier layer located between the cathode electrode and the front side of the radiation-sensitive semiconductor layer.
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