There are provided systems and methods for inspecting an endface of an optical-fiber connector using an optical-fiber connector endface inspection microscope system comprising one or more image detectors for capturing images over the whole endface to be inspected. An illumination system comprises two or more illumination sources disposed so as to illuminate respective regions over the connector endface and to prevent dark zones in the capture images. The illumination sources are activated in sequence, such that adjacent sources are never activated at the same time, and corresponding images captured in sequence, i.e., one after the other. In this case, it is also possible to activate the illumination sources in sequence, such that adjacent sources are never activated at the same time. Activating the illumination sources separately eliminates the illumination overlap and so eliminates the double image artifact. This allows for a more uniformly lit image with less dark spots.