Invention Grant
- Patent Title: Photoacid generators, photoresist compositions, and pattern formation methods
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Application No.: US17454331Application Date: 2021-11-10
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Publication No.: US12140866B2Publication Date: 2024-11-12
- Inventor: Emad Aqad
- Applicant: Rohm and Haas Electronic Materials LLC
- Applicant Address: US MA Marlborough
- Assignee: Rohm and Haas Electronic Materials LLC
- Current Assignee: Rohm and Haas Electronic Materials LLC
- Current Assignee Address: US MA Marlborough
- Agent Jonathan D. Baskin
- Main IPC: G03F7/004
- IPC: G03F7/004 ; C07C51/02 ; C07C303/32 ; C07C309/12 ; C07C381/12 ; C08F220/30 ; G03F7/039 ; G03F7/20 ; G03F7/30 ; G03F7/32

Abstract:
Photoacid generators comprising a moiety of formula (1): wherein: Ar1 is a substituted or unsubstituted aryl group; R1 is an alkyl or aryl group, each of which may be substituted or unsubstituted, wherein Ar1 and R1 are optionally connected together by a single bond or a divalent linking group to form a ring; Y is a single bond or a divalent group; and * is the point of attachment of the moiety to another atom of the photoacid generator. The photoacid generator compounds find particular use in photoresist compositions that can be used to form lithographic patterns for the formation of electronic devices.
Public/Granted literature
- US20220214614A1 PHOTOACID GENERATORS, PHOTORESIST COMPOSITIONS, AND PATTERN FORMATION METHODS Public/Granted day:2022-07-07
Information query
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