Invention Grant
- Patent Title: Field effect transistor and method
-
Application No.: US18295246Application Date: 2023-04-03
-
Publication No.: US12237372B2Publication Date: 2025-02-25
- Inventor: Lung-Kun Chu , Jia-Ni Yu , Chung-Wei Hsu , Chih-Hao Wang , Kuo-Cheng Chiang , Kuan-Lun Cheng , Mao-Lin Huang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Seed IP Law Group
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L21/8234 ; H01L27/092 ; H01L29/66 ; H01L29/78

Abstract:
A device includes a substrate, and a first semiconductor channel over the substrate. The first semiconductor channel includes a first nanosheet of a first semiconductor material, a second nanosheet of a second semiconductor material in physical contact with a topside surface of the first nanosheet, and a third nanosheet of the second semiconductor material in physical contact with an underside surface of the first nanosheet. The first gate structure is over and laterally surrounding the first semiconductor channel, and in physical contact with the second nanosheet and the third nanosheet.
Public/Granted literature
- US20230238429A1 FIELD EFFECT TRANSISTOR AND METHOD Public/Granted day:2023-07-27
Information query
IPC分类: