Invention Application
- Patent Title: Birefringence measurement of large-format samples
- Patent Title (中): 大幅面样品的双折射测量
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Application No.: US10359529Application Date: 2003-02-05
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Publication No.: US20040075834A1Publication Date: 2004-04-22
- Inventor: Andrew D. Kaplan , James C. Mansfield , Douglas C. Mark
- Applicant: Hinds Instruments, Inc.
- Applicant Address: null
- Assignee: Hinds Instruments, Inc.
- Current Assignee: Hinds Instruments, Inc.
- Current Assignee Address: null
- Main IPC: G01J004/00
- IPC: G01J004/00

Abstract:
The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.
Public/Granted literature
- US06992758B2 Birefringence measurement of large-format samples Public/Granted day:2006-01-31
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