公开(公告)号：US20040075834A1

公开(公告)日：2004-04-22

申请号：US10359529

申请日：2003-02-05

Applicant: Hinds Instruments, Inc.

Inventor： Andrew D. Kaplan ,  James C. Mansfield ,  Douglas C. Mark

IPC: G01J004/00

CPC classification number: G01N21/23 ,  G01N2021/9513 ,  G01N2201/101 ,  G01N2201/103

Abstract: The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.

Abstract translation: 本公开涉及用于精确测量大幅面光学元件样品的双折射性质的系统和方法。 双折射测量系统部件相对于样品的精确运动采用了龙门式结构。 还提供了一种有效的大幅面样品保持器，其充分地支撑样品以防止其中引起的双折射，同时仍然将大面积的样品呈现给无阻碍的光通过。