发明申请
- 专利标题: Semiconductor device
- 专利标题(中): 半导体器件
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申请号: US10969625申请日: 2004-10-20
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公开(公告)号: US20050056898A1公开(公告)日: 2005-03-17
- 发明人: Satoru Kaneko , Toshiyuki Ohkoda , Takao Myono
- 申请人: Satoru Kaneko , Toshiyuki Ohkoda , Takao Myono
- 申请人地址: JP Osaka
- 专利权人: Sanyo Electric Co., Ltd., a Osaka Japan Corporation
- 当前专利权人: Sanyo Electric Co., Ltd., a Osaka Japan Corporation
- 当前专利权人地址: JP Osaka
- 优先权: JP2001-401191 20011228
- 主分类号: H01L27/04
- IPC分类号: H01L27/04 ; H01L21/822 ; H01L21/8238 ; H01L21/8249 ; H01L27/02 ; H01L27/06 ; H01L27/092 ; H03K19/0185 ; H01L29/76
摘要:
A semiconductor device for a charge pump device suitable for providing large current capacity and preventing a latch up from occurring is offered. An N-type epitaxial silicon layer is formed on a P-type single crystalline silicon substrate, and a P-type well region is formed in the N-type epitaxial silicon layer. A P+-type buried layer abutting on a bottom of the P-type well region and an N+-type buried layer partially overlapping with the P+-type buried layer and electrically isolating the P-type well region from the single crystalline silicon substrate are formed. And then, an MOS transistor is formed in the P-type well region.