发明申请
- 专利标题: Exposure apparatus and exposure method
- 专利标题(中): 曝光装置和曝光方法
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申请号: US11008631申请日: 2004-12-10
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公开(公告)号: US20050157278A1公开(公告)日: 2005-07-21
- 发明人: Soichi Owa , Naomasa Shiraishi , Takashi Aoki
- 申请人: Soichi Owa , Naomasa Shiraishi , Takashi Aoki
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JP2002-169496 20020611
- 主分类号: G03F7/20
- IPC分类号: G03F7/20 ; G03B27/52
摘要:
An exposure apparatus able to maintain reflectances of mirrors and transmittances of lenses and to maintain initial performance over a long period by using exposure light of a wavelength of the vacuum ultraviolet region to illuminate a mask and transfer images of patterns on the mask to a substrate, provided with a gas feed unit for supplying a light path space through which the exposure light passes with a gas mainly comprised of an inert gas or rare gas and introducing a predetermined concentration of hydrogen into the gas fed to at least part of the light path space.
公开/授权文献
- US07050149B2 Exposure apparatus and exposure method 公开/授权日:2006-05-23
信息查询
IPC分类: