发明申请
US20050160575A1 INTEGRATION OF HIGH PERFORMANCE COPPER INDUCTORS WITH BOND PADS
有权
高性能铜电感器与BOND PADS的集成
- 专利标题: INTEGRATION OF HIGH PERFORMANCE COPPER INDUCTORS WITH BOND PADS
- 专利标题(中): 高性能铜电感器与BOND PADS的集成
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申请号: US10707896申请日: 2004-01-22
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公开(公告)号: US20050160575A1公开(公告)日: 2005-07-28
- 发明人: Jeffrey Gambino , William Motsiff , Erick Walton
- 申请人: Jeffrey Gambino , William Motsiff , Erick Walton
- 申请人地址: US VT Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US VT Armonk
- 主分类号: H01F41/04
- IPC分类号: H01F41/04 ; H01L21/02 ; H01L21/3205 ; H01L21/60 ; H01L21/822 ; H01L23/31 ; H01L23/52 ; H01L23/522 ; H01L23/532 ; H01L27/04 ; H01F7/06 ; H05K3/02
摘要:
Integration of high performance copper inductors are provided wherein a tall, Cu laminate spiral inductor is formed at the last metal level, and at the last metal+1 level, with the metal levels being interconnected by a bar via having the same spiral shape as the spiral metal inductors at the last metal level and the last metal+1 level. The invention provides methods for integrating the formation of thick inductors with the formation of bond pads, terminals and interconnect wiring with the last metal+1 wiring. The subject invention uses dielectric deposition, spacer formation, and/or selective deposition of a passivating metal such as CoWP, to passivate a Cu inductor that is formed after the last metal layer.
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