Invention Application
- Patent Title: Mass spectrometer
- Patent Title (中): 质谱仪
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Application No.: US11006591Application Date: 2004-12-08
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Publication No.: US20050178955A1Publication Date: 2005-08-18
- Inventor: Takashi Baba , Yuichiro Hashimoto
- Applicant: Takashi Baba , Yuichiro Hashimoto
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Priority: JP2004-039502 20040217
- Main IPC: G01N27/62
- IPC: G01N27/62 ; H01J49/04 ; H01J49/34 ; H01J49/40 ; H01J49/42 ; H01J49/26

Abstract:
The present invention provides a mass spectrometry capable of high-efficiency and high-throughput ECD. An electron source and a two-dimensional combined ion trap in which a magnetic field along and generally parallel to a central axis is applied are used, thereby to achieve the foregoing object. First, precursor ions are trapped. By adopting the two-dimensional combined ion trap, it is possible to obtain a high ion trapping efficiency upon being injected and trapping. Subsequently, electrons are made incident thereon in such a manner as to be wound along the central axis to which no radio frequency is applied by using a magnetic field. For this reason, it is possible to allow energy-controlled electrons to reach the precursor ions. It is possible to implement a mass spectrometer capable of avoiding heating due to a radio frequency electric field, and effecting high-throughput/high-efficiency ECD.
Public/Granted literature
- US07166835B2 Mass spectrometer Public/Granted day:2007-01-23
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