发明申请
US20050185708A1 Apparatus for measuring jitter, method of measuring jitter and computer-readable medium storing a program thereof
审中-公开
用于测量抖动的装置，测量抖动的方法以及存储其程序的计算机可读介质
- 专利标题： Apparatus for measuring jitter, method of measuring jitter and computer-readable medium storing a program thereof
- 专利标题（中）： 用于测量抖动的装置，测量抖动的方法以及存储其程序的计算机可读介质
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申请号： US11060212申请日： 2005-02-17
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公开(公告)号： US20050185708A1公开(公告)日： 2005-08-25
- 发明人: Takahiro Yamaguchi , Masahiro Ishida , Mani Soma
- 申请人： Takahiro Yamaguchi , Masahiro Ishida , Mani Soma
- 申请人地址： JP Tokyo
- 专利权人： Advantest Corporation
- 当前专利权人： Advantest Corporation
- 当前专利权人地址： JP Tokyo
- 主分类号： G01R29/02
- IPC分类号： G01R29/02 ; G01R29/26 ; G01R31/317 ; G01R31/3193 ; H04L1/20 ; H04L25/02 ; H04Q1/20
摘要：
A jitter measurement apparatus for measuring the jitter of a signal-under-test includes a squarer for obtaining a squared signal which results from raising the signal-under-test to the 2N-th power (N is a positive integer) and a timing jitter estimator for obtaining a timing jitter sequence of the signal-under-test based on the squared signal.
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