Abstract:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, having a signal converting section for calculating a spectrum of the signal-under-measurement, a bandwidth calculating section for calculating frequency where a saturation rate of a value of the integrated spectrum of the signal-under-measurement becomes almost equal to a saturation rate set in advance in a band-to-be-measured set in advance as upper cutoff frequency of the band-to-be-measured to calculate the jitter and a jitter calculating section for measuring the jitter in the signal-under-measurement based on the spectaum in the band-to-be-measured of the signal-under-measurement.
Abstract:
Timing jitter sequences Δφj[n] and Δφk[n] of respective clock signals under measurement xj(t) and xk(t) are estimated, and a timing difference sequence between those timing jitter sequences is calculated. In addition, initial phase angles φ0j and φ0k of linear instantaneous phases of the xj(t) and xk(t) are estimated, respectively. A sum of a difference between those initial angles and the timing difference sequence is calculated to obtain a clock skew sequence between the xj(t) and xk(t).
Abstract:
Timing jitter sequences Δφj[n] and Δφk[n] of respective clock signals under measurement xj(t) and xk(t) are estimated, and a timing difference sequence between those timing jitter sequences is calculated. In addition, initial phase angles φ0j and φ0k of linear instantaneous phases of the xj(t) and xk(t) are estimated, respectively. A sum of a difference between those initial angles and the timing difference sequence is calculated to obtain a clock skew sequence between the xj(t) and xk(t).
Abstract:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
Abstract:
A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.
Abstract:
A clock waveform XC(t) is transformed into a complex analytic signal using a Hilbert transformer and an instantaneous phase of this analytic signal is estimated. A linear phase is subtracted from the instantaneous phase to obtain a varying term &Dgr;&phgr;(t). A difference between the maximum value and the minimum value of the varying term &Dgr;&phgr;(t) is obtained as a peak-to-peak jitter, and a root-mean-square of the varying term &Dgr;&phgr;(t) is calculated to obtain an RMS jitter.
Abstract:
Timing jitter sequences &Dgr;&phgr;j[n] and &Dgr;&phgr;k[n] of respective clock signals under measurement xj(t) and xk(t) are obtained, and a covariance &sgr;tj,tk=(1/N)&Sgr;i=1N&Dgr;&phgr;j[i]·&Dgr;&phgr;k[i] is obtained. In addition, root-mean-square values &sgr;tj and &sgr;tk of the respective &Dgr;&phgr;j[n] and &Dgr;&phgr;k[n] are obtained, and a cross-correlation coefficient &rgr;=&sgr;tj,tk/(&sgr;tj·&sgr;tk) between the xj(t) and xk(t) is calculated.
Abstract:
An input clock signal is transformed into a complex analytic signal zc(t) by an analytic signal transforming means 13 and an instantaneous phase of its real part xc(t) is estimated using the analytic signal zc(t). A linear phase is removed from the instantaneous phase to obtain a phase noise waveform &Dgr;&phgr;(t). A peak value &Dgr;&phgr;max of absolute values of the &Dgr;&phgr;(t) is obtained, and 4&Dgr;&phgr;max is defined as the worst value of period jitter of the input signal. The &Dgr;&phgr;(t) is sampled at a timing close to a zero-crossing point of the xc(t) to extract the sample value. A differential between adjacent samples is obtained in the sequential order to calculate a root-mean-square value of the differentials (period jitters). An exp(−(2&Dgr;&phgr;max)2/(2&sgr;j2)) is calculated from the mean-square value &sgr;j and 2&Dgr;&phgr;max, and the calculated value is defined as a probability that a period jitter exceeds 2&Dgr;&phgr;max.
Abstract:
There is provided a method and an apparatus for detecting a delay fault in a phase-locked loop circuit. A frequency impulse is applied to the PLL circuit under test as a reference clock, and a waveform of a signal outputted from the PLL circuit under test is transformed to an analytic signal to estimate its instantaneous phase. A linear phase is estimated from the estimated instantaneous phase, and the estimated linear phase is removed from the estimated instantaneous phase to obtain a fluctuation term of the instantaneous phase. A delay fault is detected by comparing a time duration during which the PLL circuit stays in a state of oscillating a certain frequency with the time duration during which a fault-free PLL circuit stays in a state of oscillating a certain frequency.
Abstract:
A measuring apparatus including a timing jitter estimator which estimates an output timing jitter sequence which indicates the output timing jitter of an output signal based on an output signal output from a DUT in response to an input signal input to the DUT, and a jitter transfer function estimator which estimates a jitter transfer function in the DUT based on the output timing jitter sequence. The jitter transfer function estimator includes an instantaneous phase noise estimator which estimates an instant phase noise of the output signal based on an output signal, and a resampler which generates the output timing jitter sequence by resampling the instantaneous phase noise at predetermined timing.