发明申请
US20050204236A1 Interconnections for plural and hierarchical P1500 test wrappers 有权
多个和分层P1500测试包装器的互连

  • 专利标题: Interconnections for plural and hierarchical P1500 test wrappers
  • 专利标题(中): 多个和分层P1500测试包装器的互连
  • 申请号: US11096399
    申请日: 2005-04-01
  • 公开(公告)号: US20050204236A1
    公开(公告)日: 2005-09-15
  • 发明人: Lee Whetsel
  • 申请人: Lee Whetsel
  • 主分类号: G01R31/3185
  • IPC分类号: G01R31/3185 G01N15/08 G01R31/28
Interconnections for plural and hierarchical P1500 test wrappers
摘要:
This disclosure describes a test architecture for accessing IP core test wrappers within an IC and for accessing the wrappers using a Link Instruction Register (LIR). An IEEE P1500 standard is in development for providing test access to these individual cores via a test structure called a wrapper. The wrapper basically resides at the boundary of the core and provides a way to test the core and the interconnections between cores. While IEEE P1500 is standardizing the wrapper, it leaves the architectural arrangement of multiple and hierarchical wrappers within an IC up to the users of the P1500 standard.
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