发明申请
- 专利标题: Method for fabricating semiconductor packages
- 专利标题(中): 半导体封装的制造方法
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申请号: US11117158申请日: 2005-04-27
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公开(公告)号: US20050287707A1公开(公告)日: 2005-12-29
- 发明人: Ying-Ren Lin , Ho-Yi Tsai , Chien-Ping Huang , Cheng-Hsu Hsiao
- 申请人: Ying-Ren Lin , Ho-Yi Tsai , Chien-Ping Huang , Cheng-Hsu Hsiao
- 申请人地址: TW Taichung Hsien
- 专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人地址: TW Taichung Hsien
- 优先权: TW093118246 20040624
- 主分类号: H01L21/44
- IPC分类号: H01L21/44 ; H01L21/48 ; H01L21/50 ; H01L21/56 ; H01L21/68 ; H01L23/31
摘要:
A method for fabricating semiconductor packages is proposed. A plurality of substrates each having a chip thereon are prepared. Each substrate has similar length and width to the predetermined length and width of the semiconductor package. A carrier having a plurality of openings is prepared. Each opening is larger in length and width than the substrate. The substrates are positioned in the corresponding openings, and gaps between the substrates and the carrier are sealed. A molding process is performed to form an encapsulant over each opening to encapsulate the chip. An area on the carrier covered by the encapsulant is larger in length and width than the opening. After performing a mold-releasing process, a plurality of the semiconductor packages are formed by a singulation process to cut along substantially edges of each substrate according to the predetermined size of the semiconductor package. A waste of substrate material is avoided.
公开/授权文献
- US07348211B2 Method for fabricating semiconductor packages 公开/授权日:2008-03-25
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