发明申请
- 专利标题: Film-forming method
- 专利标题(中): 成膜方法
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申请号: US11174532申请日: 2005-07-06
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公开(公告)号: US20060008595A1公开(公告)日: 2006-01-12
- 发明人: Tadahiro Ishizaka , Atsushi Gomi , Tatsuo Hatano
- 申请人: Tadahiro Ishizaka , Atsushi Gomi , Tatsuo Hatano
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人地址: JP Tokyo
- 优先权: JP2004-199678 20040706
- 主分类号: H05H1/24
- IPC分类号: H05H1/24 ; C23C16/00
摘要:
A plurality of gases are prevented from being mixed with each other in a gas supply path when forming a film on a substrate to be processed so as to prevent generation of particles to enable a stable and clean film formation. A film containing metal is formed on a substrate to be processed by supplying a first process gas containing the metal and a second process gas for reducing the first process gas to a process chamber. The first process gas is supplied from a first gas supply passage to the process chamber. The second process gas is supplied from a second gas supply passage to the process chamber and the second process gas is plasma-excited in the process chamber. A first reverse flow preventing gas consisting of H2 or He is supplied to the process chamber from the first gas supply passage when supplying the second process gas.
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